Previous studies on defect patterns mainly focus on the classification of wafer defects, and these methods cannot provide effective defect location information for overlapped defect types. To solve ...

Accurate defect detection is an important element in ensuring product quality and safe equipment operation. However, due to the lack of deep cross-modal interactions (CMIs) during vision feature ...

Background: Osteochondral defects, involving both cartilage and subchondral bone, remain clinically challenging due to the poor intrinsic healing capacity of cartilage and the limited durability of ...